发明名称 SEMICONDUCTOR-SUBSTRATE MANUFACTURING METHOD AND SEMICONDUCTOR-DEVICE MANUFACTURING METHOD IN WHICH GERMANIUM LAYER IS HEAT-TREATED
摘要 A semiconductor-substrate manufacturing method that includes a step in which a germanium layer (30) having an oxygen concentration of at least 1×1016 cm-3 is heat-treated at a temperature of at least 700°C in a reductive gas atmosphere. Also, a semiconductor-substrate manufacturing method that includes a step in which a germanium layer (30) having an oxygen concentration of at least 1×1016 cm-3 is heat-treated in a reductive gas atmosphere such that said oxygen concentration decreases.
申请公布号 WO2015064338(A1) 申请公布日期 2015.05.07
申请号 WO2014JP77135 申请日期 2014.10.10
申请人 JAPAN SCIENCE AND TECHNOLOGY AGENCY 发明人 TORIUMI, AKIRA;LEE, CHOONG-HYUN;NISHIMURA, TOMONORI
分类号 H01L21/324;H01L21/336;H01L29/78 主分类号 H01L21/324
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