发明名称 |
SEMICONDUCTOR-SUBSTRATE MANUFACTURING METHOD AND SEMICONDUCTOR-DEVICE MANUFACTURING METHOD IN WHICH GERMANIUM LAYER IS HEAT-TREATED |
摘要 |
A semiconductor-substrate manufacturing method that includes a step in which a germanium layer (30) having an oxygen concentration of at least 1×1016 cm-3 is heat-treated at a temperature of at least 700°C in a reductive gas atmosphere. Also, a semiconductor-substrate manufacturing method that includes a step in which a germanium layer (30) having an oxygen concentration of at least 1×1016 cm-3 is heat-treated in a reductive gas atmosphere such that said oxygen concentration decreases. |
申请公布号 |
WO2015064338(A1) |
申请公布日期 |
2015.05.07 |
申请号 |
WO2014JP77135 |
申请日期 |
2014.10.10 |
申请人 |
JAPAN SCIENCE AND TECHNOLOGY AGENCY |
发明人 |
TORIUMI, AKIRA;LEE, CHOONG-HYUN;NISHIMURA, TOMONORI |
分类号 |
H01L21/324;H01L21/336;H01L29/78 |
主分类号 |
H01L21/324 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|