发明名称 |
METHOD FOR REMOVING SACRIFICIAL FILM, AND SUBSTRATE PROCESSING APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for removing a sacrificial film and a substrate processing apparatus which enable the uniform removal of a sacrificial film from a surface of a substrate while suppressing or preventing the collapse of a pattern.SOLUTION: A method for removing a sacrificial film from a surface of a wafer where cylinders and the sacrificial film embedded between the cylinders are formed comprises: a sacrificial film pre-etching step S35 of removing the sacrificial film to a halfway depth by supplying an etchant to the wafer surface; a second rinse step S36 of rinsing off a residue attaching to the wafer surface by supplying a rinse liquid to the wafer surface; a dry step S37 of removing a liquid component on the wafer surface therefrom; and a dry etching step S39 of removing the sacrificial film remaining on the wafer surface by supplying an etching gas to the wafer surface. |
申请公布号 |
JP2015088619(A) |
申请公布日期 |
2015.05.07 |
申请号 |
JP20130225859 |
申请日期 |
2013.10.30 |
申请人 |
SCREEN HOLDINGS CO LTD;CENTRAL GLASS CO LTD |
发明人 |
OKUTANI MANABU;UMEZAKI TOMONORI;KIKUCHI AKIO |
分类号 |
H01L21/306;H01L21/302;H01L21/304 |
主分类号 |
H01L21/306 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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