发明名称 METHOD FOR REMOVING SACRIFICIAL FILM, AND SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a method for removing a sacrificial film and a substrate processing apparatus which enable the uniform removal of a sacrificial film from a surface of a substrate while suppressing or preventing the collapse of a pattern.SOLUTION: A method for removing a sacrificial film from a surface of a wafer where cylinders and the sacrificial film embedded between the cylinders are formed comprises: a sacrificial film pre-etching step S35 of removing the sacrificial film to a halfway depth by supplying an etchant to the wafer surface; a second rinse step S36 of rinsing off a residue attaching to the wafer surface by supplying a rinse liquid to the wafer surface; a dry step S37 of removing a liquid component on the wafer surface therefrom; and a dry etching step S39 of removing the sacrificial film remaining on the wafer surface by supplying an etching gas to the wafer surface.
申请公布号 JP2015088619(A) 申请公布日期 2015.05.07
申请号 JP20130225859 申请日期 2013.10.30
申请人 SCREEN HOLDINGS CO LTD;CENTRAL GLASS CO LTD 发明人 OKUTANI MANABU;UMEZAKI TOMONORI;KIKUCHI AKIO
分类号 H01L21/306;H01L21/302;H01L21/304 主分类号 H01L21/306
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