摘要 |
A semiconductor device of an embodiment is provided with a memory, a register configured to store a first data group including test data and read/write instruction data to the memory, a first inversion portion having an inverting function of a value of the test data outputted from the register, a second inversion portion having the inverting function of a value of the read/write instruction data outputted from the register, first and second input portions configured to input a data inversion instruction to the first and second inversion portions, and a data switching portion configured to switch between a test data group obtained by applying predetermined processing to the first data group outputted from the register through the first and second inversion portions and a second data group used for reading/writing of data held in the memory during a system operation as input data into the memory. |