DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND SIGNAL INPUT DEVICE

摘要

PROBLEM TO BE SOLVED: To accurately and quickly specify an unevenness defect region of a display due to electric capacitance.SOLUTION: An inspection device (10) includes: an image part (2) which acquires a first picked-up image (IM1) and a second picked-up image (IM2) obtained by picking up each of inspection images with voltage values (V1) and (V2) of counter voltages of a liquid crystal panel (70); and a defect determination part (40) which determines an unevenness defect region (F) based upon a comparison result between the first picked-up image (IM1) and second picked-up image (IM2).