发明名称 MULTI-LINE WIDTH PATTERN CREATED USING PHOTOLITHOGRAPHY
摘要 Systems and methods are provided for forming features through photolithography. A polymer layer is formed over a substrate. The polymer layer is patterned to form a first feature and a second feature, the first feature and the second feature being separated at a first distance. A rinse material is applied to the polymer layer including the first feature and the second feature. The rinse material is removed from the polymer layer including the first feature and the second feature to cause the first feature and the second feature to come into contact with each other. A third feature is formed based on the first feature and the second feature being in contact with each other.
申请公布号 US2015125788(A1) 申请公布日期 2015.05.07
申请号 US201314071750 申请日期 2013.11.05
申请人 Taiwan Semiconductor Manufacturing Company Limited 发明人 TAI CHUN-LIANG;YEN BI-MING;LEE CHUN-HUNG;CHEN DE-FANG
分类号 G03F7/40;G03F7/20 主分类号 G03F7/40
代理机构 代理人
主权项 1. A method comprising: forming a polymer layer over a substrate; patterning the polymer layer to form a first feature and a second feature, the first feature and the second feature being separated at a first distance; applying a rinse material to the polymer layer including the first feature and the second feature; removing the rinse material from the polymer layer including the first feature and the second feature to cause the first feature and the second feature to come into contact with each other; and forming a third feature based on the first feature and the second feature being in contact with each other.
地址 Hsinchu TW