发明名称 |
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
The inventive concepts provide semiconductor devices and methods of manufacturing the same. One semiconductor device includes a substrate, a device isolation layer disposed on the substrate, a fin-type active pattern defined by the device isolation layer and having a top surface higher than a top surface of the device isolation layer, a first conductive line disposed on an edge portion of the fin-type active pattern and on the device isolation layer adjacent to the edge portion of the fin-type active pattern, and an insulating thin layer disposed between the fin-type active pattern and the first conductive line. The first conductive line forms a gate electrode of an anti-fuse that may be applied with a write voltage. |
申请公布号 |
US2015123209(A1) |
申请公布日期 |
2015.05.07 |
申请号 |
US201414532152 |
申请日期 |
2014.11.04 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
CHOI Hyun-Min;MAEDA Shigenobu;YOON Jihoon;LIM SUNGMAN |
分类号 |
H01L27/112;H01L29/423;H01L23/525;H01L29/06;H01L29/78 |
主分类号 |
H01L27/112 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a substrate; a device isolation layer on the substrate; a fin-type active pattern defined by the device isolation layer, the fin-type active pattern extending in a first direction, and the fin-type active pattern having a top surface higher than a top surface of the device isolation layer; a first conductive line on an edge portion of the fin-type active pattern and on the device isolation layer adjacent to the edge portion of the fin-type active pattern; and an insulating thin layer between the fin-type active pattern and the first conductive line, wherein the first conductive line pattern forms a gate electrode of an anti-fuse to which a write voltage is applied. |
地址 |
Suwon-si KR |