发明名称 |
MECHANISMS FOR FORMING METAL-INSULATOR-METAL (MIM) CAPACITOR STRUCTURE |
摘要 |
Embodiments of mechanisms for forming a semiconductor device with metal-insulator-metal (MIM) capacitor structure are provided. The MIM capacitor structure includes a substrate; and a MIM capacitor formed on the substrate. The MIM capacitor includes a bottom electrode formed over the substrate. The bottom electrode is a top metal layer. The MIM capacitor also includes an insulating layer formed on the bottom electrode; and a top electrode formed on the insulating layer. |
申请公布号 |
US2015123242(A1) |
申请公布日期 |
2015.05.07 |
申请号 |
US201314069864 |
申请日期 |
2013.11.01 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD |
发明人 |
JEN Chi-Chung;HSU Chia-Lun |
分类号 |
H01L49/02;H01L23/535 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. A metal-insulator-metal (MIM) capacitor structure, comprising:
a substrate; and a MIM capacitor formed on the substrate, wherein the MIM capacitor comprises:
a bottom electrode formed over the substrate, wherein the bottom electrode is a first portion of a top metal layer;an insulating layer formed on the bottom electrode;a top electrode formed on the insulating layer; anda barrier layer formed over the top electrode. |
地址 |
Hsin-Chu TW |