发明名称 MECHANISMS FOR FORMING METAL-INSULATOR-METAL (MIM) CAPACITOR STRUCTURE
摘要 Embodiments of mechanisms for forming a semiconductor device with metal-insulator-metal (MIM) capacitor structure are provided. The MIM capacitor structure includes a substrate; and a MIM capacitor formed on the substrate. The MIM capacitor includes a bottom electrode formed over the substrate. The bottom electrode is a top metal layer. The MIM capacitor also includes an insulating layer formed on the bottom electrode; and a top electrode formed on the insulating layer.
申请公布号 US2015123242(A1) 申请公布日期 2015.05.07
申请号 US201314069864 申请日期 2013.11.01
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 JEN Chi-Chung;HSU Chia-Lun
分类号 H01L49/02;H01L23/535 主分类号 H01L49/02
代理机构 代理人
主权项 1. A metal-insulator-metal (MIM) capacitor structure, comprising: a substrate; and a MIM capacitor formed on the substrate, wherein the MIM capacitor comprises: a bottom electrode formed over the substrate, wherein the bottom electrode is a first portion of a top metal layer;an insulating layer formed on the bottom electrode;a top electrode formed on the insulating layer; anda barrier layer formed over the top electrode.
地址 Hsin-Chu TW