| 摘要 |
<p>PROBLEM TO BE SOLVED: To acquire measuring instrument, measuring system, and measuring method capable of easily measuring axial chromatic aberration.SOLUTION: A chart 10 comprises a thin flat plate 12 and seven transmission ports 11a-g. The thin flat plate 12 is a thin plate with the thickness of 1 mm or less having a rectangular front face (front plane) 13 and a back face (rear plane 14). The front face 13 and the back face 14 are subjected to the processing of not reflecting light such as coating with the paint. Thus, the front face 13 and the back face 14 do not reflect light. The center of the front face 13 is regarded as O. An aspect ratio of the front face 13 and the back face 14 is the same as an aspect ratio of an imaging element which is described later. Each of the transmission ports 11a-g is a hole which penetrates in a thickness direction of the thin flat plate 12, and has a rectangular shape extending in a short side direction of the thin flat plate front face, when viewed from the direction along the thickness direction of the thin flat plate 12. The transmission ports 11a-g transmit light from the back face 14 through the front face 13 or from the front face 13 through the back face 14.</p> |
