发明名称 METAL OXIDE SEMICONDUCTOR SENSOR AND METHOD OF FORMING A METAL OXIDE SEMICONDUCTOR SENSOR USING ATOMIC LAYER DEPOSITION
摘要 A semiconductor sensor device includes a substrate, a non-suitable seed layer located above the substrate, at least one electrode located above the non-suitable seed layer, and a porous sensing layer supported directly by the non- suitable seed layer and in electrical communication with the at least one electrode, the porous sensing layer defining a plurality of grain boundaries formed by spaced-apart nucleation on the non-suitable seed layer using atomic layer deposition.
申请公布号 WO2015066289(A1) 申请公布日期 2015.05.07
申请号 WO2014US63094 申请日期 2014.10.30
申请人 ROBERT BOSCH GMBH;SAMARAO, ASHWIN, K.;O'BRIEN, GARY;FEYH, ANDO;PURKL, FABIAN;YAMA, GARY 发明人 SAMARAO, ASHWIN, K.;O'BRIEN, GARY;FEYH, ANDO;PURKL, FABIAN;YAMA, GARY
分类号 H01L27/14;H01L21/205;H01L29/94 主分类号 H01L27/14
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