发明名称 MICRO DISPLACEMENT MEASUREMENT SYSTEM
摘要 <p>PROBLEM TO BE SOLVED: To provide a micro displacement measurement system configured to change moving-amount magnification of a moire fringe without configuration change or additional imaging.SOLUTION: A micro displacement measurement system includes: a marker arranged on an object to be measured and having a fringe pattern; a camera 12 for imaging the marker; and an image processing apparatus which creates reference grating image data on the basis of the image captured by the camera 12, a predetermined length of marker interval, and a predetermined moving-amount magnification, and generates moire fringe data from the captured image and the reference grating image data, to measure micro displacement. The moving-amount magnification of a moire fringe can be changed without configuration change or additional imaging.</p>
申请公布号 JP2015087135(A) 申请公布日期 2015.05.07
申请号 JP20130223861 申请日期 2013.10.29
申请人 MEIDENSHA CORP 发明人 FUJISAWA TAKAMASA
分类号 G01B11/00;G01H9/00 主分类号 G01B11/00
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