发明名称 |
METHOD FOR SEPARATING SEMICONDUCTOR DEVICES USING NANOPOROUS STRUCTURE |
摘要 |
The present invention relates to a method for separating semiconductor devices from a substrate using a nanoporous structure, wherein electrochemical etching is carried out in the absence of a surface metal layer, then the surface metal layer is deposited, and then a GaN thin film is transferred onto a metal wafer by means of wafer bonding and lift-off. The method for separating the semiconductor devices using a nanoporous structure includes the steps of: growing a first n-type nitride layer on the substrate; growing a dielectric layer on the first n-type nitride layer; forming a nanoporous structure in the first n-type nitride layer by means of electrochemical etching; re-growing a second n-type nitride layer on the first n-type nitride layer so as to form a second n-type nitride layer containing the dielectric layer; growing a multi-quantum well structure and a p-type nitride layer on the second n-type nitride layer for bonding with a conductive substrate; and separating the semiconductor devices from the substrate through selective HF etching of the dielectric layer. |
申请公布号 |
US2015125981(A1) |
申请公布日期 |
2015.05.07 |
申请号 |
US201314377101 |
申请日期 |
2013.02.06 |
申请人 |
Seoul Viosys Co., Ltd. ;University Industry Liaison Office of Chonnam National University |
发明人 |
Ryu Sang Wan;Kang Jin Ho |
分类号 |
H01L33/00 |
主分类号 |
H01L33/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for separating semiconductor devices from a substrate using a nanoporous structure, the method comprising:
forming a first conductivity-type nitride layer on a substrate; forming a dielectric layer on the first conductivity-type nitride layer; forming a nanoporous structure in the first conductivity-type nitride layer using electrolytic etching; forming a second first conductivity-type nitride layer on the first conductivity-type nitride layer and the dielectric layer; forming a multi-quantum well structure and a second conductivity-type nitride layer on the second first conductivity-type nitride layer; bonding the multi-quantum well structure and the second conductivity-type nitride layer to a conductive substrate; and separating the second first conductivity-type nitride layer from the substrate by selectively etching the dielectric layer using HF. |
地址 |
Ansan-si KR |