发明名称 METHOD FOR TESTING WAVELENGTH VARIABLE LASER DEVICE AND WAVELENGTH VARIABLE LASER DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method for testing a wavelength variable laser device and the wavelength variable laser device capable of suppressing errors in light-transmitting characteristics of an etalon.SOLUTION: There is disclosed a method for testing a wavelength variable laser device which is equipped with a wavelength variable laser and wavelength detection means having an etalon. This method includes: a first step for measuring a free spectral region interval of the etalon: a second step for acquiring drive conditions by tuning the wavelength into a target value provided between the top and the bottom of the free spectral region interval; and a third step for storing the drive conditions in a memory.
申请公布号 JP2015088626(A) 申请公布日期 2015.05.07
申请号 JP20130226020 申请日期 2013.10.30
申请人 SUMITOMO ELECTRIC IND LTD 发明人 SAKANO EIICHI
分类号 H01S5/0687 主分类号 H01S5/0687
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