发明名称 |
METHOD FOR TESTING WAVELENGTH VARIABLE LASER DEVICE AND WAVELENGTH VARIABLE LASER DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for testing a wavelength variable laser device and the wavelength variable laser device capable of suppressing errors in light-transmitting characteristics of an etalon.SOLUTION: There is disclosed a method for testing a wavelength variable laser device which is equipped with a wavelength variable laser and wavelength detection means having an etalon. This method includes: a first step for measuring a free spectral region interval of the etalon: a second step for acquiring drive conditions by tuning the wavelength into a target value provided between the top and the bottom of the free spectral region interval; and a third step for storing the drive conditions in a memory. |
申请公布号 |
JP2015088626(A) |
申请公布日期 |
2015.05.07 |
申请号 |
JP20130226020 |
申请日期 |
2013.10.30 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
SAKANO EIICHI |
分类号 |
H01S5/0687 |
主分类号 |
H01S5/0687 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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