发明名称 SUBSTRATE PROCESSING APPARATUS, AND SUBSTRATE PROCESSING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus and a substrate processing method which enable in-plane uniform processing on a substrate by utilizing plasma light emission.SOLUTION: A substrate processing apparatus comprises: a process chamber 1; an annular plasma generation room 40; a gas-supply unit 27 for introducing a plasma-generation gas into the annular plasma generation room 40; a microwave-introduction unit 43 for introducing microwaves into the plasma generation room 40, where plasma of the plasma-generation gas is produced by the introduced microwaves, and the plasma thus produced emits vacuum-ultraviolet light having a wavelength of 200 nm or less; and a transmission window 41 which the generated vacuum-ultraviolet light to be directed at a processing space S1 inside the process chamber 1 is passed through. In process chamber, the treatments including the film growth on a substrate S and etching are performed with the aid of light energy of the vacuum-ultraviolet light.
申请公布号 JP2015088663(A) 申请公布日期 2015.05.07
申请号 JP20130227052 申请日期 2013.10.31
申请人 TOKYO ELECTRON LTD 发明人 IIZUKA YASHIRO
分类号 H01L21/205;C23C16/48;C23C16/517;H01L21/31;H01L21/318;H05H1/46 主分类号 H01L21/205
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