发明名称 TEST PROGRAM AND TEST SYSTEM
摘要 A test program allows an information technology equipment connected to a tester hardware to control the tester hardware. The tester hardware is configured to be capable of changing at least a part of its functions according to configuration data stored in rewritable nonvolatile memory. The test program is configured as a combination of a control program and a test algorithm module. The test program comprises: a module that acquires the configuration data from the nonvolatile memory of the tester hardware and a module that judges whether or not a storage device holds a test algorithm module that can be used together with the configuration data.
申请公布号 US2015127986(A1) 申请公布日期 2015.05.07
申请号 US201514597217 申请日期 2015.01.15
申请人 ADVANTEST CORPORATION 发明人 TAHARA Yoshifumi
分类号 G06F11/263 主分类号 G06F11/263
代理机构 代理人
主权项 1. A test program embedded on a non-transitory computer-readable recording medium, allowing an information technology equipment connected to a tester hardware to control the tester hardware, the test program comprising: a module that acquires configuration data stored in a rewritable memory of the tester hardware, the tester hardware being configured to be capable of changing at least a part of its functions according to the configuration data; and a module that judges whether or not a storage device of the information technology equipment holds a test algorithm module that can be used together with the configuration data, the test algorithm module stored in the storage device being already acquired by the user, wherein the test program is configured as a combination of a control program and a test algorithm module that defines a test algorithm.
地址 Tokyo JP