发明名称 |
Integrated metal resistor |
摘要 |
A plurality of first wiring layers (M1) are arranged on a main surface of a substrate (SUB), a first insulating film (SO12) is arranged on upper faces of the plurality of first wiring layers (M1), a second insulating film (SO13) is arranged on an upper face of the first insulating film (SO 12), and a plurality of second wiring layers (M2) are arranged on the second insulating film (SO13). A metal resistive element layer (Rmn) is arranged just below at least one second wiring layer (M2) among the plurality of second wiring layers (M2). A plurality of conductive layers (CP1) extend from the plurality of second wiring layers (M2) respectively to the metal resistive element layer (Rmn) in a Z direction perpendicular to the main surface. The metal resistive element layer (Rmn) includes a metal wiring layer (Rm). At least one part of a side face of at least one conductive layer (CP1) among the plurality of conductive layers (CP1) is connected to the metal wiring layer (Rm). |
申请公布号 |
EP2869343(A2) |
申请公布日期 |
2015.05.06 |
申请号 |
EP20140190281 |
申请日期 |
2014.10.24 |
申请人 |
RENESAS ELECTRONICS CORPORATION |
发明人 |
TOKUMITSU, SHIGEO;MORI, TAKAHIRO;NITTA, TETSUYA |
分类号 |
H01L27/08;H01L23/522;H01L23/532;H01L49/02 |
主分类号 |
H01L27/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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