发明名称 GROWTH METHOD OF GAN ON SI FOR REDUCING CRACKS
摘要 Disclosed is a method of growing GaN on Si substrate for reducing cracks. A method of growing GaN on Si substrate according to an embodiment of the present invention includes: a first step of depositing a metal N composite of an N flux surplus state on a substrate by the growth chamber of a molecular beam epitaxial apparatus and forming a first metal N composite layer; a second step of depositing a N composite of a metal flux surplus state on the first metal N composite layer and forming a second metal N composite layer; a third step of doping the second metal N composite layer with Mg, depositing GaN of an N flux surplus state, and forming a first GaN layer; and a fourth step of depositing GaN of a Ga flux surplus state on the first GaN layer and forming a second GaN layer.
申请公布号 KR101517808(B1) 申请公布日期 2015.05.06
申请号 KR20130167983 申请日期 2013.12.31
申请人 KOREA ELECTRONICS TECHNOLOGY INSTITUTE 发明人 ROH, CHEONG HYUN;HAN, CHEOL KOO;SONG, HONG JU;LEE, JUN HO
分类号 H01L21/20;H01L33/00 主分类号 H01L21/20
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