发明名称 |
GROWTH METHOD OF GAN ON SI FOR REDUCING CRACKS |
摘要 |
Disclosed is a method of growing GaN on Si substrate for reducing cracks. A method of growing GaN on Si substrate according to an embodiment of the present invention includes: a first step of depositing a metal N composite of an N flux surplus state on a substrate by the growth chamber of a molecular beam epitaxial apparatus and forming a first metal N composite layer; a second step of depositing a N composite of a metal flux surplus state on the first metal N composite layer and forming a second metal N composite layer; a third step of doping the second metal N composite layer with Mg, depositing GaN of an N flux surplus state, and forming a first GaN layer; and a fourth step of depositing GaN of a Ga flux surplus state on the first GaN layer and forming a second GaN layer. |
申请公布号 |
KR101517808(B1) |
申请公布日期 |
2015.05.06 |
申请号 |
KR20130167983 |
申请日期 |
2013.12.31 |
申请人 |
KOREA ELECTRONICS TECHNOLOGY INSTITUTE |
发明人 |
ROH, CHEONG HYUN;HAN, CHEOL KOO;SONG, HONG JU;LEE, JUN HO |
分类号 |
H01L21/20;H01L33/00 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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