发明名称 EPITAXIAL WAFER, LIGHT-RECEIVING ELEMENT, OPTICAL SENSOR DEVICE, AND METHOD FOR MANUFACTURING EPITAXIAL WAFER AND LIGHT-RECEIVING ELEMENT
摘要 <p>Provided are an epitaxial wafer, a photodiode, and the like that include an antimony-containing layer and can be efficiently produced such that protruding surface defects causing a decrease in the yield can be reduced and impurity contamination causing degradation of the performance can be suppressed. The production method includes a step of growing an antimony (Sb)-containing layer on a substrate 1 by metal-organic vapor phase epitaxy using only metal-organic sources; and a step of growing, on the antimony-containing layer, an antimony-free layer including a window layer 5, wherein, from the growth of the antimony-containing layer to completion of the growth of the window layer, the growth is performed at a growth temperature of 425°C or more and 525°C or less.</p>
申请公布号 EP2626890(A4) 申请公布日期 2015.05.06
申请号 EP20110830608 申请日期 2011.10.03
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 FUJII, KEI;AKITA, KATSUSHI;ISHIZUKA, TAKASHI
分类号 H01L21/205;B82Y20/00;C23C16/30;C30B25/10;C30B25/18;C30B29/40;H01L21/02;H01L31/0352;H01L31/10;H01L31/105;H01L31/18 主分类号 H01L21/205
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