发明名称 Imaging systems with circuit element in carrier wafer
摘要 An imaging system may include an image sensor package with an image sensor wafer mounted on a carrier wafer, which may be a silicon substrate. A capacitor may be formed in the carrier wafer. Trenches may be etched in a serpentine pattern in the silicon substrate. Conductive plates of the capacitor may be formed at least partially in the trenches. An insulator material may be formed between the capacitor and the silicon substrate. A dielectric layer may be formed between the conductive plates of the capacitor. The image sensor package may be mounted on a printed circuit board via a ball grid array. Conductive vias may electrically couple the capacitor and the image sensor wafer to the printed circuit board.
申请公布号 US9024406(B2) 申请公布日期 2015.05.05
申请号 US201314035863 申请日期 2013.09.24
申请人 Semiconductor Components Industries, LLC 发明人 Churchwell Scott;Sulfridge Marc;Borthakur Swarnal
分类号 H01L27/146 主分类号 H01L27/146
代理机构 Treyz Law Group 代理人 Treyz Law Group ;Woodruff Kendall P.
主权项 1. Apparatus, comprising: a carrier wafer comprising a silicon substrate with a surface, wherein a trench is formed in the surface; an image sensor wafer having an array of image pixels, wherein the image sensor wafer is mounted on the carrier wafer; and a circuit element that is at least partially formed within the trench in the surface of the carrier wafer.
地址 Phoenix AZ US