发明名称 Method and apparatus for sensing tunnel magneto-resistance
摘要 In one embodiment, an apparatus comprises: an MRAM (magnetic random access memory) cell array comprising a plurality of MRAM cells including a calibration cell and a plurality of data cells; a reference MRAM cell controlled by a control signal; and a sensing-amplifier/latch; wherein: said plurality of data cells are used for storing user data; the calibration cell is used for a calibration purpose; the reference MRAM cell serves as a reference for comparison with a MRAM cell selected within the MRAM cell array; the sensing-amplifier/latch outputs a logical signal based on comparing a resistance of the MRAM cell selected within the MRAM cell array and a resistance of the reference MRAM cell; and the control signal is established in a calibration process by comparing a resistance of the calibration cell with the resistance of the reference MRAM cell.
申请公布号 US9025367(B1) 申请公布日期 2015.05.05
申请号 US201314089893 申请日期 2013.11.26
申请人 Realtek Semiconductor Corp. 发明人 Lin Chia-Liang
分类号 G11C11/00;G11C11/16 主分类号 G11C11/00
代理机构 McClure, Qualey & Rodack, LLP 代理人 McClure, Qualey & Rodack, LLP
主权项 1. An apparatus, comprising: an MRAM (magnetic random access memory) cell array, comprising: a plurality of MRAM cells, comprising: a calibration cell for a calibration; anda plurality of data cells for storing user data;a reference MRAM cell controlled by a control signal; anda sensing-amplifier/latch for outputting a logical signal based on comparing a resistance of the MRAM cell selected within the plurality of MRAM cells and a resistance of the reference MRAM cell, wherein the control signal is established in a calibration process by comparing a resistance of the calibration cell with the resistance of the reference MRAM cell.
地址 Hsinchu TW
您可能感兴趣的专利