发明名称 |
Method and apparatus for sensing tunnel magneto-resistance |
摘要 |
In one embodiment, an apparatus comprises: an MRAM (magnetic random access memory) cell array comprising a plurality of MRAM cells including a calibration cell and a plurality of data cells; a reference MRAM cell controlled by a control signal; and a sensing-amplifier/latch; wherein: said plurality of data cells are used for storing user data; the calibration cell is used for a calibration purpose; the reference MRAM cell serves as a reference for comparison with a MRAM cell selected within the MRAM cell array; the sensing-amplifier/latch outputs a logical signal based on comparing a resistance of the MRAM cell selected within the MRAM cell array and a resistance of the reference MRAM cell; and the control signal is established in a calibration process by comparing a resistance of the calibration cell with the resistance of the reference MRAM cell. |
申请公布号 |
US9025367(B1) |
申请公布日期 |
2015.05.05 |
申请号 |
US201314089893 |
申请日期 |
2013.11.26 |
申请人 |
Realtek Semiconductor Corp. |
发明人 |
Lin Chia-Liang |
分类号 |
G11C11/00;G11C11/16 |
主分类号 |
G11C11/00 |
代理机构 |
McClure, Qualey & Rodack, LLP |
代理人 |
McClure, Qualey & Rodack, LLP |
主权项 |
1. An apparatus, comprising:
an MRAM (magnetic random access memory) cell array, comprising:
a plurality of MRAM cells, comprising:
a calibration cell for a calibration; anda plurality of data cells for storing user data;a reference MRAM cell controlled by a control signal; anda sensing-amplifier/latch for outputting a logical signal based on comparing a resistance of the MRAM cell selected within the plurality of MRAM cells and a resistance of the reference MRAM cell, wherein the control signal is established in a calibration process by comparing a resistance of the calibration cell with the resistance of the reference MRAM cell. |
地址 |
Hsinchu TW |