发明名称 |
On-chip interferers for standards compliant jitter tolerance testing |
摘要 |
Systems and methods that facilitate on-chip testing are provided. An integrated circuit can include a transmitter configured to transmit a communications signal via a communications channel. The integrated circuit can also include a receiver configured to receive the communications signal via the communications channel. A jitter creation module also can form part of the integrated circuit and can introduce jitter into the system thereby allowing for on-chip jitter testing. The jitter creation module can form either part of the transmitter or receiver and can introduce the jitter by phase interpolation. |
申请公布号 |
US9025693(B2) |
申请公布日期 |
2015.05.05 |
申请号 |
US201213538871 |
申请日期 |
2012.06.29 |
申请人 |
Broadcom Corporation |
发明人 |
Wang John;Parthasarathy Vasudevan |
分类号 |
H04B17/00 |
主分类号 |
H04B17/00 |
代理机构 |
Sterne, Kessler, Goldstein & Fox P.L.L.C. |
代理人 |
Sterne, Kessler, Goldstein & Fox P.L.L.C. |
主权项 |
1. An integrated circuit for communicating signals with predetermined jitter, comprising:
an output queue having a signal input, a clock input and an output, wherein the output queue is configured to output a signal received at the signal input according to a clock signal received at the clock input; a phase adjuster configured to receive a phase adjustment input signal, and generate the clock signal by shifting the phase adjustment input signal according to a received phase control signal, and output the clock signal to the clock input of the output queue; a jitter test module configured to receive a jitter input signal and generate a jitter control signal based on the jitter input signal; and a combiner configured to produce the phase control signal by combining the jitter control signal with a transmit control signal. |
地址 |
Irvine CA US |