发明名称 Semiconductor device and method of manufacturing semiconductor device
摘要 A semiconductor device includes a first insulating film formed above a semiconductor substrate, a fuse formed above the first insulating film, a second insulating film formed above the first insulating film and the fuse and including an opening reaching the fuse, and a third insulating film formed above the second insulating film and in the opening.
申请公布号 US9024410(B2) 申请公布日期 2015.05.05
申请号 US201213606710 申请日期 2012.09.07
申请人 Fujitsu Semiconductor Limited 发明人 Takeda Shigetoshi
分类号 H01L23/525 主分类号 H01L23/525
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A semiconductor device comprising: a semiconductor substrate; a first insulating film formed above the semiconductor substrate; a fuse formed above the first insulating film, the fuse including a first region and a second region; a fourth insulating film formed on the first insulating film and the fuse, whole of the side surface of the fuse of the first region being covered by a part of the fourth insulating film; a second insulating film formed above the first insulating film and formed on the fuse, the second insulating film including an opening formed therethrough, the opening exposing the part of the fourth insulating film; and a third insulating film formed above the second insulating film and in the opening, whole of the part of the fourth insulating film being covered by the third insulating film.
地址 Yokohama PA US