发明名称 |
Method and system for monitoring operation of a system asset |
摘要 |
A device for use in monitoring operation of a system includes a display device and a processor coupled to the display device. The processor is configured to display, on the display device, a three-dimensional plot of a first operational characteristic of a system asset as a function of a second operational characteristic and as a function of a third operational characteristic of the system asset. The processor is also configured to receive a selection of the second operational characteristic, transform the three-dimensional plot into a two-dimensional plot of the first operational characteristic as a function of the third operational characteristic at the selected second characteristic, and display the two-dimensional plot on the display device. |
申请公布号 |
US9024950(B2) |
申请公布日期 |
2015.05.05 |
申请号 |
US201213589726 |
申请日期 |
2012.08.20 |
申请人 |
General Electric Company |
发明人 |
Joshi Mandar Sadashiv;Menon Ajith Krishnan |
分类号 |
G06T15/00;G05B23/02 |
主分类号 |
G06T15/00 |
代理机构 |
Fletcher Yoder, P.C. |
代理人 |
Fletcher Yoder, P.C. |
主权项 |
1. A device for use in monitoring operation of a system, said device comprising:
a display device; and a processor coupled to said display device, said processor configured to: display, on said display device, a three-dimensional plot of a first operational characteristic of a system asset as a function of a second operational characteristic and a third operational characteristic of the system asset; receive a selection of the second operational characteristic; display a two-dimensional plane within the three-dimensional plot at the selected second operational characteristic; identify a peak of each of a plurality of spectrums where the two-dimensional plane intersects each of the plurality of spectrums; display, on the display device, a line contained within the two-dimensional plane and connecting each of the identified peaks; transform the three-dimensional plot into a two-dimensional plot of the first operational characteristic as a function of the third operational characteristic at the selected second characteristic; and display the two-dimensional plot on said display device. |
地址 |
Schenectady NY US |