发明名称 Method and system for monitoring operation of a system asset
摘要 A device for use in monitoring operation of a system includes a display device and a processor coupled to the display device. The processor is configured to display, on the display device, a three-dimensional plot of a first operational characteristic of a system asset as a function of a second operational characteristic and as a function of a third operational characteristic of the system asset. The processor is also configured to receive a selection of the second operational characteristic, transform the three-dimensional plot into a two-dimensional plot of the first operational characteristic as a function of the third operational characteristic at the selected second characteristic, and display the two-dimensional plot on the display device.
申请公布号 US9024950(B2) 申请公布日期 2015.05.05
申请号 US201213589726 申请日期 2012.08.20
申请人 General Electric Company 发明人 Joshi Mandar Sadashiv;Menon Ajith Krishnan
分类号 G06T15/00;G05B23/02 主分类号 G06T15/00
代理机构 Fletcher Yoder, P.C. 代理人 Fletcher Yoder, P.C.
主权项 1. A device for use in monitoring operation of a system, said device comprising: a display device; and a processor coupled to said display device, said processor configured to: display, on said display device, a three-dimensional plot of a first operational characteristic of a system asset as a function of a second operational characteristic and a third operational characteristic of the system asset; receive a selection of the second operational characteristic; display a two-dimensional plane within the three-dimensional plot at the selected second operational characteristic; identify a peak of each of a plurality of spectrums where the two-dimensional plane intersects each of the plurality of spectrums; display, on the display device, a line contained within the two-dimensional plane and connecting each of the identified peaks; transform the three-dimensional plot into a two-dimensional plot of the first operational characteristic as a function of the third operational characteristic at the selected second characteristic; and display the two-dimensional plot on said display device.
地址 Schenectady NY US