发明名称 |
Horizontally oriented and vertically stacked memory cells |
摘要 |
Horizontally oriented and vertically stacked memory cells are described herein. One or more method embodiments include forming a vertical stack having a first insulator material, a first memory cell material on the first insulator material, a second insulator material on the first memory cell material, a second memory cell material on the second insulator material, and a third insulator material on the second memory cell material, forming an electrode adjacent a first side of the first memory cell material and a first side of the second memory cell material, and forming an electrode adjacent a second side of the first memory cell material and a second side of the second memory cell material. |
申请公布号 |
US9024283(B2) |
申请公布日期 |
2015.05.05 |
申请号 |
US201313759576 |
申请日期 |
2013.02.05 |
申请人 |
Micron Technology, Inc. |
发明人 |
Quick Timothy A.;Marsh Eugene P. |
分类号 |
H01L29/02;H01L45/00;H01L27/24 |
主分类号 |
H01L29/02 |
代理机构 |
Brooks, Cameron & Huebsch, PLLC |
代理人 |
Brooks, Cameron & Huebsch, PLLC |
主权项 |
1. A memory device, comprising:
at least two vertically stacked memory cells, wherein each of the memory cells include:
a memory cell material having a recess formed therein;a first electrode in direct contact with a single first side of the memory cell material; anda second electrode in the recess and in direct contact with a single second side of the memory cell material. |
地址 |
Boise ID US |