发明名称 One-dimensional x-ray detector with curved readout strips
摘要 A detector for a small-angle x-ray diffraction system uses curved readout strips shaped to correspond to the expected intensity distribution of x-rays scattered by the system. This expected intensity distribution may be a series of concentric circles, and each of the strips has a shape that approximates a section of an annulus. The strips may be positioned on a substrate such that a center of curvature of the curved strips is located along an edge of a readout region within which the strips are located or, alternatively, at a geometric center of the readout region. The detector may have a signal readout system that uses a delay line or, alternatively, a multichannel readout system. The detector may make use of electron generation via interaction of the diffracted x-ray beam with a gas in a gas chamber, or through interaction of the diffracted beam with a semiconductor material.
申请公布号 US9024268(B2) 申请公布日期 2015.05.05
申请号 US201313833346 申请日期 2013.03.15
申请人 Bruker AXS, Inc. 发明人 Durst Roger D.;Laggner Peter;Medved Sergei A.;Becker Bruce L.
分类号 G01T1/24;G01T1/16;G01N23/201 主分类号 G01T1/24
代理机构 Robic, LLP 代理人 Robic, LLP
主权项 1. A detector for detecting a diffracted x-ray beam from a small-angle x-ray diffraction system, the detector comprising: a plurality of readout strips on a substantially planar substrate at which electrons generated by the energy of the diffracted x-ray beam are collected, the readout strips each following a different curved path that corresponds to a region of substantially constant intensity of the diffracted x-ray beam, and each being located adjacent to one another within a readout plane; and a signal readout system that detects the presence of electrical signals at the readout strips resulting from said collected electrons and associates each electrical signal with the readout strip at which it originated.
地址 Madison WI US