DISTURBANCE TEST APPARATUS

摘要

The present invention provides a disturbance test apparatus comprising: a waveform generator which generates a disturbance waveform; an output terminal electrically connected to the waveform generator, outputting the disturbance induced by the disturbance waveform to a device to be tested; and an output location controller which controls a location of the output terminal. According to an embodiment of the present invention, the present invention provides a technology which makes it possible to accurately understand a location where disturbance is output to a device to be tested in an electromagnetic wave susceptibility test.