发明名称 |
横向双扩散金氧半导体装置及其制造方法;LATERAL DOUBLE DIFFUSED METAL-OXIDE-SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME |
摘要 |
一种横向双扩散金氧半导体装置,包括:半导体基板;磊晶半导体层,形成于该半导体基板上;闸极结构,设置于该磊晶半导体层上;第一掺杂区,设置于邻近该闸极结构之一第一侧之该磊晶半导体层内;第二掺杂区,设置于相对该闸极结构之该第一侧之一第二侧之该磊晶半导体层内;第三掺杂区,设置于该第一掺杂区内;第四掺杂区,设置于该第二掺杂区内;沟槽,形成于该第三掺杂区、该第一掺杂区与该第一掺杂区下方之该磊晶半导体层中;导电接触物,位于该沟槽内;以及第五掺杂区,设置于该第一掺杂区下方之该磊晶半导体层内。; an epitaxial semiconductor layer disposed over the semiconductor substrate; a gate structure disposed over the epitaxial semiconductor layer; a first doping region disposed in the epitaxial semiconductor layer at a first side of the gate structure; a second doping region disposed in the epitaxial semiconductor layer at a second side of the gate structure; a third doping region disposed in the first doping region; a fourth doping region disposed in the second doping region; a trench formed in the third doping region, the first doping region and the epitaxial semiconductor layer under the first doping region; a conductive contact formed in the trench; and a fifth doping region disposed in the epitaxial semiconductor layer under the trench. |
申请公布号 |
TW201517267 |
申请公布日期 |
2015.05.01 |
申请号 |
TW102139481 |
申请日期 |
2013.10.31 |
申请人 |
世界先进积体电路股份有限公司 VANGUARD INTERNATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
李琮雄 LEE, TSUNG HSIUNG;张睿钧 CHANG, JUI CHUN |
分类号 |
H01L29/78(2006.01);H01L21/28(2006.01) |
主分类号 |
H01L29/78(2006.01) |
代理机构 |
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代理人 |
洪澄文颜锦顺 |
主权项 |
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地址 |
新竹县新竹科学工业园区园区三路123号 TW |