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发明名称
测试装置以及类比至数位转换器之测试方法
摘要
申请公布号
TWI483555
申请公布日期
2015.05.01
申请号
TW100146406
申请日期
2011.12.15
申请人
慧荣科技股份有限公司
发明人
张宏盛
分类号
H03M1/10
主分类号
H03M1/10
代理机构
代理人
洪澄文 台北市南港区三重路19之6号2楼;颜锦顺 台北市南港区三重路19之6号2楼
主权项
一种测试装置,接收一类比至数位转换器输出之多个位元信号,包括:多个频率计数器(frequency counter),分别计算该等位元信号之位元值变换的次数,以得到多个转换次数;一比较模组,分别比较该等转换次数与对应于该等转换次数之多个转换次数理想值以得到多个误差次数;以及一效能分析模组,依据该等误差次数估计该类比至数位转换器之一效能值。
地址
新竹县竹北市台元街36号8楼之1
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