发明名称 PARTICLE ADSORPTION MICROPROBE
摘要 Provided is a novel particle adsorption microprobe for picking up an extremely fine particle by adsorbing the particle, which can selectively pick up only one extremely fine particle without requiring the application of a physical stress in picking up the particle and without contaminating a foreign matter surface in picking up the particle, and allows the particle to be analytically evaluated as it is in an analyzer after its picking-up. A particle adsorption microprobe of the present invention includes a carbon nanotube aggregate including a plurality of carbon nanotubes and adsorbs only one particle having a diameter of 10 μm or less.
申请公布号 US2015114141(A1) 申请公布日期 2015.04.30
申请号 US201314398759 申请日期 2013.06.12
申请人 NITTO DENKO CORPORATION 发明人 Maeno Youhei
分类号 G01N1/04;G01N15/10 主分类号 G01N1/04
代理机构 代理人
主权项 1. A particle adsorption microprobe, comprising a carbon nanotube aggregate including a plurality of carbon nanotubes, wherein the particle adsorption microprobe adsorbs only one particle having a diameter of 10 μm or less.
地址 Ibaraki-shi, Osaka JP