发明名称 |
PARTICLE ADSORPTION MICROPROBE |
摘要 |
Provided is a novel particle adsorption microprobe for picking up an extremely fine particle by adsorbing the particle, which can selectively pick up only one extremely fine particle without requiring the application of a physical stress in picking up the particle and without contaminating a foreign matter surface in picking up the particle, and allows the particle to be analytically evaluated as it is in an analyzer after its picking-up. A particle adsorption microprobe of the present invention includes a carbon nanotube aggregate including a plurality of carbon nanotubes and adsorbs only one particle having a diameter of 10 μm or less. |
申请公布号 |
US2015114141(A1) |
申请公布日期 |
2015.04.30 |
申请号 |
US201314398759 |
申请日期 |
2013.06.12 |
申请人 |
NITTO DENKO CORPORATION |
发明人 |
Maeno Youhei |
分类号 |
G01N1/04;G01N15/10 |
主分类号 |
G01N1/04 |
代理机构 |
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代理人 |
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主权项 |
1. A particle adsorption microprobe, comprising a carbon nanotube aggregate including a plurality of carbon nanotubes, wherein the particle adsorption microprobe adsorbs only one particle having a diameter of 10 μm or less. |
地址 |
Ibaraki-shi, Osaka JP |