发明名称 OPTICAL COMPONENT INSPECTION DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide an optical component inspection device in which when performing defect inspection of an optical component held on a pallet, a position of the optical component is not deviated and variation in inspection accuracy can be prevented.SOLUTION: An optical component inspection device 100 that performs defect inspection of a plurality of optical components held on a pallet 10 includes: an imaging device 40 that has an illumination device 41 that projects light onto optical components K held on the pallet 10 and a camera device 42 that picks up images of the optical components K on which the light is projected by the illumination device 41; a movement device 50 that moves the imaging device 40 parallel to a top surface of the pallet 10; and imaging control means that causes the images of the optical components K to be picked up while the imaging device 40 is moved by the movement device 50 with respect to the pallet 10 in a state of being rest at a given position.</p>
申请公布号 JP2015083921(A) 申请公布日期 2015.04.30
申请号 JP20120018247 申请日期 2012.01.31
申请人 KONICA MINOLTA INC 发明人 SEKI HIROHIKO;YUSE AKIRA
分类号 G01N21/958 主分类号 G01N21/958
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