| 摘要 |
<p>Disclosed is a switching element inspection method for inspecting an electronic circuit unit (1) that includes a plurality of switching elements (M1, M2) connected in parallel to each other. A first test voltage that is larger than a threshold voltage of the switching elements (M1, M2) to be inspected is applied to a control terminal of one switching element to be inspected, said one switching element having been selected out of the switching elements (M1, M2), and a voltage difference between the first terminals of the switching elements (M1, M2) and second terminals of the switching elements (M1, M2) is inspected.</p> |
