发明名称 TECHNIQUE FOR FABRICATION OF MICROELECTRONIC CAPACITORS AND RESISTORS
摘要 A sequence of semiconductor processing steps permits formation of both vertical and horizontal nanometer-scale serpentine resistors and parallel plate capacitors within a common structure. The method of fabricating such a structure cleverly takes advantage of a CMP process non-uniformity in which the CMP polish rate of an insulating material varies according to a certain underlying topography. By establishing such topography underneath a layer of the insulating material, different film thicknesses of the insulator can be created in different areas by leveraging differential polish rates, thereby avoiding the use of a lithography mask. In one embodiment, a plurality of resistors and capacitors can be formed as a compact integrated structure within a common dielectric block, using a process that requires only two mask layers. The resistors and capacitors thus formed as a set of integrated circuit elements are suitable for use as microelectronic fuses and antifuses, respectively, to protect underlying microelectronic circuits.
申请公布号 US2015115401(A1) 申请公布日期 2015.04.30
申请号 US201314068198 申请日期 2013.10.31
申请人 International Business Machines Corporation ;STMicroelectronics, Inc. 发明人 Zhang John H.;Clevenger Lawrence A.;Radens Carl;Xu Yiheng;Wornyo Edem
分类号 H01L49/02;H01L21/3105;H01L21/02 主分类号 H01L49/02
代理机构 代理人
主权项 1. An integrated electronic structure comprising: a semiconductor substrate extending in a first plane; a pair of metal serpentines in a vertical orientation orthogonal to the first plane of the substrate; and a dielectric separating the pair of metal serpentines, the integrated electronic structure forming: a vertical serpentine resistor;a plurality of horizontal parallel plate capacitors; anda plurality of generally vertical parallel plate capacitors.
地址 Armonk NY US
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