发明名称 |
TECHNIQUE FOR FABRICATION OF MICROELECTRONIC CAPACITORS AND RESISTORS |
摘要 |
A sequence of semiconductor processing steps permits formation of both vertical and horizontal nanometer-scale serpentine resistors and parallel plate capacitors within a common structure. The method of fabricating such a structure cleverly takes advantage of a CMP process non-uniformity in which the CMP polish rate of an insulating material varies according to a certain underlying topography. By establishing such topography underneath a layer of the insulating material, different film thicknesses of the insulator can be created in different areas by leveraging differential polish rates, thereby avoiding the use of a lithography mask. In one embodiment, a plurality of resistors and capacitors can be formed as a compact integrated structure within a common dielectric block, using a process that requires only two mask layers. The resistors and capacitors thus formed as a set of integrated circuit elements are suitable for use as microelectronic fuses and antifuses, respectively, to protect underlying microelectronic circuits. |
申请公布号 |
US2015115401(A1) |
申请公布日期 |
2015.04.30 |
申请号 |
US201314068198 |
申请日期 |
2013.10.31 |
申请人 |
International Business Machines Corporation ;STMicroelectronics, Inc. |
发明人 |
Zhang John H.;Clevenger Lawrence A.;Radens Carl;Xu Yiheng;Wornyo Edem |
分类号 |
H01L49/02;H01L21/3105;H01L21/02 |
主分类号 |
H01L49/02 |
代理机构 |
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代理人 |
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主权项 |
1. An integrated electronic structure comprising:
a semiconductor substrate extending in a first plane; a pair of metal serpentines in a vertical orientation orthogonal to the first plane of the substrate; and a dielectric separating the pair of metal serpentines, the integrated electronic structure forming:
a vertical serpentine resistor;a plurality of horizontal parallel plate capacitors; anda plurality of generally vertical parallel plate capacitors. |
地址 |
Armonk NY US |