发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which the area occupied by a transistor and a capacitative element is small.SOLUTION: A semiconductor device comprises: a semiconductor substrate; a first transistor using the semiconductor substrate; a second transistor having a region which at least partially overlaps the first transistor; and a capacitative element. The second transistor comprises: a semiconductor; a first conductive film and a second conductive film that have a region in contact with an upper surface and a side surface of the semiconductor; a first insulating film that has a region in contact with the upper surface and the side surface of the semiconductor; and a third conductive film that has a region facing the upper surface and the side surface of the semiconductor via the first insulating film. The capacitative element is in contact with the first conductive film and comprises: a second insulating film that has an opening reaching the first conductive film; a fourth conductive film that has a region in contact with a bottom surface and a side surface of the opening; a third insulating film that has a region facing the bottom surface and the side surface of the opening via the fourth conductive film; and a fifth conductive film that has a region facing the fourth conductive film via the third insulating film. |
申请公布号 |
JP2015084418(A) |
申请公布日期 |
2015.04.30 |
申请号 |
JP20140189638 |
申请日期 |
2014.09.18 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
KATO KIYOSHI;MIYAIRI HIDEKAZU;NAGATSUKA SHUHEI |
分类号 |
H01L29/786;H01L21/205;H01L21/28;H01L21/316;H01L21/318;H01L21/336;H01L21/365;H01L21/471;H01L21/473;H01L21/8242;H01L21/8244;H01L21/8247;H01L27/108;H01L27/11;H01L27/115;H01L29/417;H01L29/423;H01L29/49;H01L29/788;H01L29/792 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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