发明名称 SUPERJUNCTION DEVICE AND SEMICONDUCTOR STRUCTURE COMPRISING THE SAME
摘要 The present disclosure relates to a superjunction device and a semiconductor structure having the same. The superjunction device includes a body region of a second conduction type, a drain region of a first conduction type, a drift region located between said body region and said drain region. The drift region includes first regions of a first conduction type and second regions of a second conduction type arranged alternately along a direction being perpendicular to the direction from the body region to the drain region, and a plurality of trench gate structures, each of them comprising a trench extending into said drift region from an upper surface of said body region and a gate electrode in said trench surrounded by a first dielectric layer filling said trench, and a source region of a first conduction type embedded into said body region. There is no source region along at least 10% of the total interface length between the first dielectric layer and the body region.
申请公布号 US2015115355(A1) 申请公布日期 2015.04.30
申请号 US201414524193 申请日期 2014.10.27
申请人 Infineon Technologies Austria AG 发明人 Hirler Franz;Mauder Anton
分类号 H01L29/78;H01L29/10;H01L29/423 主分类号 H01L29/78
代理机构 代理人
主权项 1. A superjunction device, which comprises: a drain region of a first conduction type; a body region of a second conduction type; a drift region located between said body region and said drain region, the drift region comprises first regions of a first conduction type and second regions of a second conduction type arranged alternately along a direction being perpendicular to the direction from the body region to the drain region; a plurality of trench gate structures, each of them comprising a trench extending into said drift region from an upper surface of said body region and a gate electrode in said trench surrounded by a first dielectric layer filling said trench; and a source region of a first conduction type embedded into said body region; wherein there is no source region along at least 10% of the total interface length between the first dielectric layer and the body region.
地址 Villach AT