发明名称 |
IMAGE QUALITY MEASUREMENT BASED ON LOCAL AMPLITUDE AND PHASE SPECTRA |
摘要 |
A method and system for determining a quality metric score for image processing are described including accepting a reference image, performing a pyramid transformation on the accepted reference image to produce a predetermined number of scales, applying image division to each scale to produce reference image patches, accepting a distorted image, performing a pyramid transformation on the accepted distorted image to produce the predetermined number of scales, applying image division to each scale to produce distorted image patches, performing a local distortion calculation for corresponding reference and distorted image patches, summing local distortion calculation results for image patch pairs, multiplying results of the summation operation by a positive weight for each scale, summing the results of the multiplication operation and applying a sigmoid function to results of the second summation operation to produce the quality metric score. |
申请公布号 |
US2015117763(A1) |
申请公布日期 |
2015.04.30 |
申请号 |
US201214394626 |
申请日期 |
2012.05.31 |
申请人 |
Zhang Fan;Chen Zhibo;Jiang Wenfei |
发明人 |
Zhang Fan;Chen Zhibo;Jiang Wenfei |
分类号 |
G06T7/00;G06K9/66;G06T3/40 |
主分类号 |
G06T7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method for determining a quality metric score for image processing, said method comprising:
accepting a reference image; performing a pyramid transformation on said accepted reference image to produce a predetermined number of scales; applying image division to each scale to produce reference image patches; accepting a distorted image; performing a pyramid transformation on said accepted distorted image to produce said predetermined number of scales; applying image division to each scale to produce distorted image patches; performing a local distortion calculation for corresponding reference and distorted image patches; summing local distortion calculation results for image patch pairs; multiplying results of said summation operation by a positive weight for each scale; summing the results of said multiplication operation; and applying a sigmoid function to results of said second summation operation to produce said quality metric score. |
地址 |
Beijing CN |