发明名称 KENNELLY CIRCLE INTERPOLATION OF IMPEDANCE MEASUREMENTS
摘要 Embodiments of the invention are directed to systems, methods and computer program products for interpolating impedance data associated with an electronic device. The present invention enables faster electronic device impedance analysis which in turn will have an impact on memory allocation associated with a computing system that controls the electronic device. An exemplary method comprises receiving complex impedance data; converting the complex impedance data to polar impedance data, wherein the polar impedance data defines a Kennelly circle; normalizing the polar impedance data based on at least one parameter associated with the Kennelly circle; and interpolating the polar impedance data for a selected frequency.
申请公布号 US2015117655(A1) 申请公布日期 2015.04.30
申请号 US201314086310 申请日期 2013.11.21
申请人 Sony Corporation 发明人 Edgren Anders;Zhao Grace
分类号 H04R29/00 主分类号 H04R29/00
代理机构 代理人
主权项 1. A method for interpolating complex impedance data associated with an electronic device, the method comprising: receiving, using a computing device processor, the complex impedance data; converting, using a computing device processor, the complex impedance data to polar impedance data, wherein the polar impedance data defines a Kennelly circle; normalizing, using a computing device processor, the polar impedance data based on at least one parameter associated with the Kennelly circle; and interpolating, using a computing device processor, the polar impedance data for a selected frequency.
地址 Tokyo JP