发明名称 Microscopic Imaging Device, Microscopic Imaging Method, And Microscopic Imaging Program
摘要 To provide a microscopic imaging device capable of easily switching the imaging method. During sectioning observation and normal observation, a measuring object is irradiated with pattern measurement light and uniform measurement light generated by a light modulation element, respectively. The measuring object is irradiated with the pattern measurement light and the uniform measurement light through a common light path. During the sectioning observation, a spatial phase of the pattern is sequentially moved on the measuring object by a predetermined amount by the light modulation element, and sectioning image data indicating an image of the measuring object is generated based on a plurality of pieces of image data generated at a plurality of phases of the pattern based on the light receiving signal. During the normal observation, normal image data indicating an image of the measuring object is generated based on the light receiving signal.
申请公布号 US2015116478(A1) 申请公布日期 2015.04.30
申请号 US201414481956 申请日期 2014.09.10
申请人 Keyence Corporation 发明人 Fujiwara Masaki
分类号 G02B21/06 主分类号 G02B21/06
代理机构 代理人
主权项 1. A microscopic imaging device comprising: a first light projecting section that emits light; a light modulation element that is configured to selectively generate first measurement light with a pattern and second measurement light without a pattern from the light emitted by the first light projecting section; a first light projection optical system that irradiates a measuring object with the first and second measurement light generated by the light modulation element through a common light path; a light receiving section that receives light from the measuring object and outputs a light receiving signal indicating a light receiving amount; an image data generating portion that generates image data based on the light receiving signal output from the light receiving section; a pattern generating portion that generates a pattern to be irradiated on the measuring object while sequentially moving a spatial phase by a predetermined amount; an instructing section that switches a first observation mode of observing the measuring object using the first measurement light and a second observation mode of observing the measuring object using the second measurement light; and a controller that controls the light modulation element based on the pattern generated by the pattern generating portion and controls the image data generating portion to generate sectioning image data indicating an image of the measuring object based on a plurality of pieces of image data generated at a plurality of phases of the pattern during the first observation mode, and controls the image data generating portion to generate normal image data indicating an image of the measuring object during the second observation mode.
地址 Osaka JP