发明名称 SEMICONDUCTOR DEVICE
摘要 A semiconductor device includes: a drift layer having a first conduction type; a base layer having a second conduction type and formed on the drift layer; an emitter layer having the first conduction type and formed in a surface layer portion of the base layer; a buffer layer having the first conduction type and formed in the drift layer separated from the base layer; a collector layer having the second conduction type and formed selectively in the buffer layer; a gate insulation film in contact with a channel region of the base layer between the drift layer and the emitter layer; a gate electrode formed on the gate insulation film; a first electrode electrically connected to the base layer and the emitter layer; and a second electrode electrically connected to the buffer layer and the collector layer. The buffer layer has a carrier density smaller than a space charge density.
申请公布号 US2015115316(A1) 申请公布日期 2015.04.30
申请号 US201314391197 申请日期 2013.04.17
申请人 DENSO CORPORATION 发明人 Oyama Kazuhiro;Sumitomo Masakiyo;Higuchi Yasushi
分类号 H01L27/07;H01L29/739;H01L29/861 主分类号 H01L27/07
代理机构 代理人
主权项 1. A semiconductor device comprising: a drift layer having a first conduction type; a base layer having a second conduction type and formed in a surface layer portion of the drift layer; an emitter layer having the first conduction type and formed in a surface layer portion of the base layer; a buffer layer having the first conduction type and formed at a position of the drift layer separated from the base layer; a collector layer having the second conduction type and formed selectively in the buffer layer; a gate insulation film in contact with a channel region that is a portion of the base layer sandwiched between the drift layer and the emitter layer; a gate electrode formed on the gate insulation film; a first electrode electrically connected to the base layer and the emitter layer; and a second electrode electrically connected to the buffer layer and the collector layer, wherein the buffer layer has a carrier density smaller than a space charge density.
地址 Kariya-city, Aichi-pref. JP
您可能感兴趣的专利