发明名称 プラズマ処理装置
摘要 <p>A plasma processing apparatus includes: a first ground member provided in processing chamber in such a way that at least a portion of the first ground member is exposed to a processing space, wherein the first ground member forms a ground potential; a second ground member provided in an exhaust space of the processing chamber to face the first ground member in such a way that at least a portion of the second ground member is exposed to the exhaust space, wherein the second ground member forms a ground potential; and a ground rod that moves up and down between the first and second ground members and contacts any one of the first or second ground member to adjust a ground state of the first or second ground member.</p>
申请公布号 JP5710318(B2) 申请公布日期 2015.04.30
申请号 JP20110046770 申请日期 2011.03.03
申请人 发明人
分类号 H01L21/3065;H05H1/46 主分类号 H01L21/3065
代理机构 代理人
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