发明名称 METHOD FOR PREDICTING CREEP RESIDUAL LIFE OF PRODUCT DEGRADED BY HEAT AND PRESSURE, AND METHOD FOR CREATING CALIBRATION CURVE USED IN THE PREDICTION METHOD
摘要 <p>[Problem] To provide a method for predicting creep residual life of products degraded due to heat and pressure. Specifically, there is provided a method for predicting creep residual life, characterized in that the method includes a step for establishing a discretionary evaluation range on the surface of a product, and a step for determining whether or not cracking has occurred within the evaluation range, and further includes a step in which, in the event that no cracking has occurred within the evaluation range, a void number density within the evaluation range is calculated, and a step in which a damage rate of the product is calculated from the void number density, the method further including a step in which, in the event that cracking has occurred within the evaluation range, the number of crystal grains that are cut across by the largest crack occurring within the evaluation range is calculated, and a step in which a damage rate of the product is calculated from the number of crystal grains obtained thereby, the product having a bainite structure.</p>
申请公布号 WO2015059815(A1) 申请公布日期 2015.04.30
申请号 WO2013JP78957 申请日期 2013.10.25
申请人 THE CHUGOKU ELECTRIC POWER CO., INC. 发明人 ARAKAWA, DAISUKE;NISHIDA, HIDETAKA;MATSUMURA, HIDEO;MORISHITA, KEIJI
分类号 G01N17/00;G01M99/00;G01N3/00;G01N33/20 主分类号 G01N17/00
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