Microscopic Imaging Device, Microscopic Imaging Method, And Microscopic Imaging Program

摘要

To provide a microscopic imaging device in which a measuring object can be easily imaged using measurement light having a desired pattern, in which the pattern of measurement light can be changed and a phase of the pattern can be moved, without arranging a mechanical mechanism. An arbitrary pattern of a plurality of patterns of measurement light is instructed. The measurement light having an instructed pattern is generated by a light modulation element, and is applied on a measuring object. A spatial phase of the generated pattern is sequentially moved on the measuring object by a predetermined amount by the light modulation element. A plurality of pieces of pattern image data generated at a plurality of phases of the pattern is synthesized based on the light receiving signal output from the light receiving section to generate sectioning image data indicating an image of the measuring object.

主权项

1. A microscopic imaging device comprising:
a first light projecting section that emits light; a light modulation element configured to generate measurement light having an arbitrary pattern from the light emitted by the first light projecting section; an optical system that irradiates a measuring object with the measurement light generated by the light modulation element; a light receiving section that receives light from the measuring object and outputs a light receiving signal indicating a light receiving amount; an image data generating portion that generates image data based on the light receiving signal output from the light receiving section; an instructing section that instructs a measurement condition for generating a pattern of the measurement light to be generated by the light modulation element of a plurality of patterns of the measurement light; a pattern generating portion that generates a pattern to be irradiated on the measuring object while sequentially moving a spatial phase by a predetermined amount based on the measurement condition instructed by the instructing section; and a controller that controls the light modulation element based on the pattern generated by the pattern generating portion, and controls the image data generating portion to generate sectioning image data indicating an image of the measuring object based on a plurality of pieces of image data generated at a plurality of phases of the pattern.