发明名称 |
SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING DEVICE |
摘要 |
<p>A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.</p> |
申请公布号 |
EP1867997(B1) |
申请公布日期 |
2015.04.29 |
申请号 |
EP20060729780 |
申请日期 |
2006.03.23 |
申请人 |
SYSMEX CORPORATION |
发明人 |
YAMAMOTO, NORIMASA;YAMATO, TAKASHI;MATSUO, NAOHIKO;IGUCHI, SATOSHI |
分类号 |
G01N35/00 |
主分类号 |
G01N35/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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