发明名称 SPECIMEN ANALYZING METHOD AND SPECIMEN ANALYZING DEVICE
摘要 <p>A specimen analyzing method and a specimen analyzing apparatus capable of measuring interference substances before analyzing a specimen. The method comprises a step for sucking the specimen stored in a specimen container (150) and sampling it in a first container (153), a step for optically measuring the specimen in the first container, a step for sampling the specimen in a second container (154) and preparing a specimen for measurement by mixing the specimen with a reagent in the second container, and a step for analyzing the specimen for measurement according to the results of the optical measurement of the specimen.</p>
申请公布号 EP1867997(B1) 申请公布日期 2015.04.29
申请号 EP20060729780 申请日期 2006.03.23
申请人 SYSMEX CORPORATION 发明人 YAMAMOTO, NORIMASA;YAMATO, TAKASHI;MATSUO, NAOHIKO;IGUCHI, SATOSHI
分类号 G01N35/00 主分类号 G01N35/00
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