发明名称 METHOD OF MAKING STRUCTURE HAVING A GATE STACK
摘要 A method includes removing a first portion of a gate layer of a first transistor and leaving a second portion of the gate layer. The first transistor includes a drain region, a source region, and a gate stack, and the gate stack includes a gate dielectric layer, a gate conductive layer over the gate dielectric layer, and the gate layer directly on the gate conductive layer. The method includes removing a gate layer of a second transistor and forming a conductive region at a region previously occupied by the first portion of the gate layer of the first transistor, the unit resistance of the conductive region being less than that of the gate layer of the first transistor.
申请公布号 US2015118809(A1) 申请公布日期 2015.04.30
申请号 US201514593473 申请日期 2015.01.09
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHUANG Harry-Hak-Lay;SONG Ming-Hsiang;CHEN Kuo-Ji;ZHU Ming;CHEN Po-Nien;YOUNG Bao-Ru
分类号 H01L27/02;H01L29/66 主分类号 H01L27/02
代理机构 代理人
主权项 1. A method comprising: removing a first portion of a gate layer of a first transistor and leaving a second portion of the gate layer of the first transistor, the first transistor comprising a drain region, a source region, and a gate stack, the gate stack comprising a gate dielectric layer, a gate conductive layer over the gate dielectric layer, and the gate layer directly over the gate conductive layer; removing a gate layer of a second transistor; and forming a conductive region of the first transistor at a region previously occupied by the first portion of the gate layer of the first transistor, the conductive region of the first transistor having a unit resistance less than that of the gate layer of the first transistor.
地址 Hsinchu TW