发明名称 Surface position detection apparatus, exposure apparatus and exposure method
摘要 <p>A surface position detection apparatus capable of highly precisely detecting the surface position of a surface to be detected without substantially being affected by relative positional displacement due to a polarization component occurring in a light flux having passed through a reflective surface. In the apparatus, a projection system has a projection side prism member (7) having first reflective surfaces (7b, 7c), and a light receiving system has a light receiving prism member (8) having second reflective surfaces (8b, 8c) arranged in correspondence with the projection side prism member. The surface position detection apparatus further has a member for compensating relative positional displacement due to a polarization component of a light flux having passed through the first and second reflective surfaces.</p>
申请公布号 EP2520978(B1) 申请公布日期 2015.04.29
申请号 EP20120150436 申请日期 2006.06.28
申请人 NIKON CORPORATION 发明人 HIDAKA, YASUHIRO;NAGAYAMA, TADASHI
分类号 G03F9/00;G01B11/00 主分类号 G03F9/00
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