发明名称 A CHEMICAL MECHANICAL POLISHING (CMP) COMPOSITION COMPRISING INORGANIC PARTICLES AND POLYMER PARTICLES
摘要 A chemical mechanical polishing (CMP) composition, comprising (A) at least one type of inorganic particles which are dispersed in the liquid medium (C), (B) at least one type of polymer particles which are dispersed in the liquid medium (C), (C) a liquid medium, wherein the zeta-potential of the inorganic particles (A) in the liquid medium (C) and the zeta-potential of the polymer particles in the liquid medium (C) are of same signs.
申请公布号 EP2499210(A4) 申请公布日期 2015.04.29
申请号 EP20100829604 申请日期 2010.11.10
申请人 BASF SE 发明人 LAUTER, MICHAEL;RAMAN, VIJAY IMMANUEL;LI, YUZHUO;VENKATARAMAN, SHYAM SUNDAR;SHEN, DANIEL KWO-HUNG
分类号 C09G1/02;C09G1/16;C09K3/14 主分类号 C09G1/02
代理机构 代理人
主权项
地址