发明名称 |
A method of detecting an overcurrent in a triac |
摘要 |
<p>The invention concerns a method of detecting an overcurrent in a triac (3), the method comprising: a) during at least part of a conduction phase of the triac, measuring the gate potential (V G ) of the triac; and b) comparing a value based on said measurement with a reference threshold and deducing the presence or the absence of an overcurrent based on said comparison.</p> |
申请公布号 |
EP2439546(B1) |
申请公布日期 |
2015.04.29 |
申请号 |
EP20100306087 |
申请日期 |
2010.10.06 |
申请人 |
STMICROELECTRONICS (TOURS) SAS;STMICROELECTRONICS DESIGN AND APPLICATION S.R.O. |
发明人 |
DRESER, JAN;GONTHIER, LAURENT |
分类号 |
G01R19/15;G01R19/165;G01R31/26 |
主分类号 |
G01R19/15 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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