发明名称 A method of detecting an overcurrent in a triac
摘要 <p>The invention concerns a method of detecting an overcurrent in a triac (3), the method comprising: a) during at least part of a conduction phase of the triac, measuring the gate potential (V G ) of the triac; and b) comparing a value based on said measurement with a reference threshold and deducing the presence or the absence of an overcurrent based on said comparison.</p>
申请公布号 EP2439546(B1) 申请公布日期 2015.04.29
申请号 EP20100306087 申请日期 2010.10.06
申请人 STMICROELECTRONICS (TOURS) SAS;STMICROELECTRONICS DESIGN AND APPLICATION S.R.O. 发明人 DRESER, JAN;GONTHIER, LAURENT
分类号 G01R19/15;G01R19/165;G01R31/26 主分类号 G01R19/15
代理机构 代理人
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