发明名称 SERIALLY ADDRESSED SUB-PUPIL SCREEN FOR IN SITU ELECTRO-OPTICAL SENSOR WAVEFRONT MEASUREMENT
摘要 <p>A system and method for wavefront measurement of an EO sensor is performed in-situ using the sensor's EO detector in a manner that disambiguates the local wavefront measurements for different sub-pupils in time and maximizes the dynamic range for measuring the local wavefronts. A single sub-pupil sized optical beam is traced in a spatial pattern over the EO sensor's entrance pupil to serially illuminate a temporal sequence of sub-pupils to form a serially addressed sub-pupil screen. The EO detector and video card capture a video signal for one sub-pupil at a time as the optical beam traces the spatial pattern. The video signal is routed to a computer processor that generates a spatio-temporal mapping of the spatial positions of the sub-pupils in the sub-pupil screen to the temporal positions of frames in the video signal. The computer processor uses the mapping to process the video signal to compute a wavefront estimate spanning the entrance pupil.</p>
申请公布号 EP2864742(A1) 申请公布日期 2015.04.29
申请号 EP20130721154 申请日期 2013.04.15
申请人 RAYTHEON COMPANY 发明人 STREUBER, CASEY, T.;EASTON, MICHAEL, P.;PFLIBSEN, KENT, P.
分类号 G01J9/00;G01M11/02 主分类号 G01J9/00
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