发明名称 Semiconductor module system having encapsulated through wire interconnect (TWI)
摘要 A semiconductor module system includes a module substrate and a semiconductor substrate having a through wire interconnect bonded to an electrode on the module substrate. The through wire interconnect includes a via, a wire in the via having a first end bonded to a substrate contact on the semiconductor substrate and a polymer layer at least partially encapsulating the wire. The semiconductor module system can also include a second substrate stacked on the semiconductor substrate having a second through wire interconnect in electrical contact with the through wire interconnect.
申请公布号 US9018751(B2) 申请公布日期 2015.04.28
申请号 US201414257114 申请日期 2014.04.21
申请人 Micron Technology, Inc. 发明人 Hembree David R;Wood Alan G.
分类号 H01L23/04;H01L23/00;G01R1/067;H01L21/48;H01L21/56;H01L21/768;H01L23/48;H01L23/498;H01L25/065;H01L25/10;G01R1/073 主分类号 H01L23/04
代理机构 代理人 Gratton Stephen A.
主权项 1. A semiconductor module system comprising: a module substrate having an electrode; a semiconductor substrate on the module substrate having a first side, a second side, a substrate contact on the first side, and an integrated circuit in electrical communication with the substrate contact; and a through wire interconnect on the semiconductor substrate comprising a via extending through the semiconductor substrate from the first side to the second side thereof, a wire in the via having a first end with a bonded connection to the substrate contact, a portion in electrical contact with the electrode on the module substrate and a second end proximate to the second side of the semiconductor substrate, and a polymer layer on the first side at least partially encapsulating the wire.
地址 Boise ID US