发明名称 Electrical probe for testing electronic device
摘要 An electrical probe comprises a cylindrical body which has a first end including a plurality of claws and a second end opposite to the first end for cooperating with an electrical test machine, wherein a concave contact surface conforming with the curvature of a solder ball of an electronic device under test is formed between the claws, whereby the first end of the cylindrical body can be brought into line contact with the solder ball at a predetermined length to ensure a proper electrical connection, so that the accuracy of an electrical test can be increased.
申请公布号 US9018967(B2) 申请公布日期 2015.04.28
申请号 US201313951477 申请日期 2013.07.26
申请人 发明人 Hsiao Te-Hsing
分类号 G01R1/067 主分类号 G01R1/067
代理机构 代理人 Lei Leong C.
主权项 1. An electrical probe comprising a cylindrical body which has a first end including a plurality of claws and a second end opposite to the first end, wherein a concave contact surface conforming with the curvature of a solder ball of an electronic device under test is formed between the claws, the first end of the cylindrical body is brought into line contact with the solder ball at a predetermined length to ensure a proper electrical connection, the second end of the cylindrical body is slidably inserted into a sleeve containing therein a first spring which urges against the second end of the cylindrical body, so that the electrical probe is elastically urged against a corresponding solder ball of the electronic device under test, and wherein the sleeve is disposed within a hole of a fixture, the second end of the cylindrical body is further provided with a flange having a dimension greater than the sleeve, and a second spring is disposed within the hole of the fixture and fitted around the sleeve, and thus the second spring can urge against the flange of the cylindrical body to provide additional elasticity for the electrical probe.
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