发明名称 Method of fabricating gallium nitride-based semiconductor device
摘要 A method of fabricating a gallium nitride (GaN)-based semiconductor device. The method includes preparing a GaN substrate having lower and upper surfaces; growing GaN-based semiconductor layers on the upper surface of the GaN substrate to form a semiconductor stack; forming a support substrate on the semiconductor stack; and separating the GaN substrate from the semiconductor stack. The separating of the GaN substrate includes irradiating a laser from the lower surface of the GaN substrate. The laser is transmitted through the lower surface of the GaN substrate and forms a laser absorption region inside a structure consisting of the GaN substrate and the semiconductor stack.
申请公布号 US9018027(B2) 申请公布日期 2015.04.28
申请号 US201313950958 申请日期 2013.07.25
申请人 Seoul Viosys Co., Ltd. 发明人 Im Tae Hyuk;Kim Chang Yeon;Kim Young Wug
分类号 H01L21/02;H01L33/00;H01L33/32 主分类号 H01L21/02
代理机构 H.C. Park & Associates, PLC 代理人 H.C. Park & Associates, PLC
主权项 1. A method of fabricating a gallium nitride (GaN)-based semiconductor device, the method comprising: growing GaN-based semiconductor layers on an upper surface of a GaN substrate to form a semiconductor stack; forming a support substrate on the semiconductor stack; scanning a laser across a lower surface of the GaN substrate, the laser emitting a laser beam that is focused at focusing positions, such that the focusing positions form a laser absorption region inside a structure comprising the GaN substrate and the semiconductor stack; and separating the GaN substrate from the semiconductor stack to form the GaN semiconductor device.
地址 Ansan-si KR