发明名称 Method for manufacturing semiconductor device, and semiconductor device
摘要 A method according to the invention has a bonding process of mounting a semiconductor chip on an upper surface of a die pad that has the upper surface whose area is larger than a reverse side of the semiconductor chip. It also has a sealed body formation process of sealing the semiconductor chip so that an undersurface opposite to the upper surface of the die pad may be exposed after the bonding process. Here, the upper surface of the die pad is arranged around an area over which the semiconductor chip is mounted, and has a hollow part arrangement area in which a groove or multiple holes are formed. Moreover, surface roughness of the upper surface is made coarser than surface roughness of the undersurface.
申请公布号 US9018745(B2) 申请公布日期 2015.04.28
申请号 US201313898410 申请日期 2013.05.20
申请人 Renesas Corporation 发明人 Shimizu Akito;Nishikawa Kenji;Moroi Sadayuki;Imura Tomoo
分类号 H01L23/495;H01L21/56;H01L23/00;H01L23/31 主分类号 H01L23/495
代理机构 McGinn IP Law Group, PLLC 代理人 McGinn IP Law Group, PLLC
主权项 1. A semiconductor device, comprising: a die pad that has a first plane and a second plane located on the opposite side of the first plane; a plurality of leads arranged next to the die pad; a semiconductor chip that has a surface, a plurality of electrodes formed over the surface, and a reverse side located on the opposite side of the surface, and is mounted over a chip mounting area of the first plane of the die pad; a plurality of first wires that electrically couple one part of the electrodes of the semiconductor chip and the leads; a second wire that electrically couples the other part of the electrodes of the semiconductor chip and the die pad; and a sealed body that seals the semiconductor chip, the first wires, and the second wire so that a part of each of the leads and the second plane of the die pad may be exposed, wherein an area of the first plane of the die pad is larger than an area of the reverse side of the semiconductor chip, wherein the first plane of the die pad comprises the chip mounting area, a first bonding area that is located between the chip mounting area and the leads and to which the second wire is bonded, and a first hollow part arrangement area that is arranged between the first binding area and the chip mounting area and in which a groove or a plurality of holes are formed, and wherein surface roughness of the first plane in the chip mounting area, the first bonding area, and the first hollow part arrangement area is coarser than surface roughness of the second plane.
地址 Kanagawa-shi, Kanagawa JP